Test & Measurement News in Electronics | Electronics Weekly https://www.electronicsweekly.com/news/products/test-measurement-products/ Mon, 30 Mar 2026 17:38:06 +0000 en-GB hourly 1 https://wordpress.org/?v=6.8.1 https://www.electronicsweekly.com/wp-content/themes/ew/images/logo.gif Electronics Weekly https://www.electronicsweekly.com/news/products/test-measurement-products/ 125 75 SmartRay ECCO X 050G 3D laser scanning sensor for reflective surfaces https://www.electronicsweekly.com/news/products/test-measurement-products/smartray-ecco-x-050g-3d-laser-scanning-sensor-for-reflective-surfaces-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/smartray-ecco-x-050g-3d-laser-scanning-sensor-for-reflective-surfaces-2026-03/#respond Mon, 30 Mar 2026 15:50:53 +0000 https://www.electronicsweekly.com/?p=892224 SmartRay is extending its ECCO X sensor range, for 3D laser scanning, with a model featuring 3D scanning for highly reflective surfaces, the ECCO X 050G sensor. ECCO X 050G ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/smartray-ecco-x-050g-3d-laser-scanning-sensor-for-reflective-surfaces-2026-03/feed/ 0 Telonic adds Siglent SNA5000X-E VNAs https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-adds-siglent-sna5000x-e-vnas-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-adds-siglent-sna5000x-e-vnas-2026-03/#respond Mon, 30 Mar 2026 15:29:14 +0000 https://www.electronicsweekly.com/?p=892221 The Siglent SNA5000X-E vector network analyser (VNA) series, designed for RF measurement, is now available from Telonic Instruments. The two models in the SNA5000X-E series can be used for determining ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-adds-siglent-sna5000x-e-vnas-2026-03/feed/ 0 XJTAG releases XJBoardExplorer as standalone sharing tool https://www.electronicsweekly.com/news/products/test-measurement-products/xjtag-releases-xjboardexplorer-as-standalone-sharing-tool-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/xjtag-releases-xjboardexplorer-as-standalone-sharing-tool-2026-03/#respond Fri, 27 Mar 2026 14:07:39 +0000 https://www.electronicsweekly.com/?p=892123 XJTAG, the automated test equipment specialist, is making its project exploration and sharing tools available as the standalone XJBoardExplorer. Basically, it allows design teams to securely share board data across ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/xjtag-releases-xjboardexplorer-as-standalone-sharing-tool-2026-03/feed/ 0 Teradyne’s Omnyx tests PCBA for AI servers https://www.electronicsweekly.com/news/products/test-measurement-products/teradynes-omnyx-tests-pcba-for-ai-servers-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/teradynes-omnyx-tests-pcba-for-ai-servers-2026-03/#respond Mon, 23 Mar 2026 17:27:41 +0000 https://www.electronicsweekly.com/?p=891735 Teradyne is introducing Omnyx, a manufacturing test platform for detecting operational defects in printed circuit board assemblies (PCBA). It’s aimed at AI servers and data center systems and the company ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/teradynes-omnyx-tests-pcba-for-ai-servers-2026-03/feed/ 0 Marelli and AWS develop STG Agent https://www.electronicsweekly.com/news/business/marelli-and-aws-develop-stg-agent-2026-03/ https://www.electronicsweekly.com/news/business/marelli-and-aws-develop-stg-agent-2026-03/#respond Thu, 19 Mar 2026 06:17:52 +0000 https://www.electronicsweekly.com/?p=891490 Marelli and AWS have developed a System Test Generation (STG) Agent that automates one of the most critical and work-intensive steps in the validation process: the generation of system test ...

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]]> https://www.electronicsweekly.com/news/business/marelli-and-aws-develop-stg-agent-2026-03/feed/ 0 Teradyne launches SiPh and CPO tester https://www.electronicsweekly.com/news/business/teradyne-launches-siph-and-cpo-tester-2026-03/ https://www.electronicsweekly.com/news/business/teradyne-launches-siph-and-cpo-tester-2026-03/#respond Thu, 19 Mar 2026 06:14:05 +0000 https://www.electronicsweekly.com/?p=891485 Teradyne has launched an opto-electric automated test platform for high-volume silicon photonics (SiPh) and co-packaged optics (CPO). Photon 100  enables high-throughput, automated testing across all key manufacturing stages, including wafer, ...

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]]> https://www.electronicsweekly.com/news/business/teradyne-launches-siph-and-cpo-tester-2026-03/feed/ 0 Embedded: PLS extends UDE 2026 for sampling via debug interfaces https://www.electronicsweekly.com/news/products/test-measurement-products/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03/#respond Fri, 13 Mar 2026 14:56:50 +0000 https://www.electronicsweekly.com/?p=891291 PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and embedded processors has also been ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03/feed/ 0 Toshiba launches photorelays for test and measurement equipment https://www.electronicsweekly.com/news/products/test-measurement-products/toshiba-launches-photorelays-for-test-and-measurement-equipment-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/toshiba-launches-photorelays-for-test-and-measurement-equipment-2026-03/#respond Thu, 12 Mar 2026 06:06:08 +0000 https://www.electronicsweekly.com/?p=891044 Toshiba has launched four voltage-driven photorelays – TLP3407SRB, TLP3412SRB, TLP3412SRHB and TLP3412SRLB –  targeting test and measurement equipment. They are rated for operation at temperatures up to 135°C and are ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/toshiba-launches-photorelays-for-test-and-measurement-equipment-2026-03/feed/ 0 Telonic announces UK release of Siglent SMM3000X SMUs https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-announces-uk-release-of-siglent-smm3000x-smus-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-announces-uk-release-of-siglent-smm3000x-smus-2026-03/#respond Mon, 09 Mar 2026 11:17:29 +0000 https://www.electronicsweekly.com/?p=890775 Telonic Instruments, the official UK representative of Siglent Technologies, is announcing the UK release of the Siglent SMM3000X series of Source/Measure Units (SMUs). They target engineers working in semiconductor device ...

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]]> https://www.electronicsweekly.com/news/products/test-measurement-products/telonic-announces-uk-release-of-siglent-smm3000x-smus-2026-03/feed/ 0 CMX500 radio communication tester covers all NTN technologies https://www.electronicsweekly.com/news/products/test-measurement-products/cmx500-radio-communication-tester-covers-all-ntn-technologies-2026-03/ https://www.electronicsweekly.com/news/products/test-measurement-products/cmx500-radio-communication-tester-covers-all-ntn-technologies-2026-03/#respond Thu, 05 Mar 2026 11:42:21 +0000 https://www.electronicsweekly.com/?p=890529 Rohde & Schwarz’s CMX500 radio communication tester can now cover all non-terrestrial network (NTN) technologies, the company highlights. It also features a Constellation Insight Tool to create a digital twin ...

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