{"id":891291,"date":"2026-03-13T14:56:50","date_gmt":"2026-03-13T14:56:50","guid":{"rendered":"https:\/\/www.electronicsweekly.com\/?p=891291"},"modified":"2026-03-17T09:56:49","modified_gmt":"2026-03-17T09:56:49","slug":"pls-extends-ude-2026-for-sampling-via-debug-interfaces","status":"publish","type":"post","link":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/","title":{"rendered":"Embedded: PLS extends UDE 2026 for sampling via debug interfaces"},"content":{"rendered":"<p>PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and embedded processors has also been expanded.<\/p><div class=\"elect-content\" style=\"margin-left: auto; margin-right: auto; text-align: center; \" id=\"elect-1805528857\"><div id=\"x02\">\r\n<script type=\"text\/javascript\"> if ($(window).width() <= 768) { googletag.display('x02'); } <\/script>\r\n<\/div>\r\n<\/div>\n<p><a rel=\"image\" href=\"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp\"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-891293 size-full alignnone\" src=\"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp\" alt=\"PLS extends UDE 2026 for sampling via trace systems and debug interfaces\" width=\"1000\" height=\"750\" srcset=\"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp 1000w, https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000-300x225.webp 300w, https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000-768x576.webp 768w, https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000-440x330.webp 440w\" sizes=\"auto, (max-width: 1000px) 100vw, 1000px\" \/><\/a><\/p>\n<p>Data can now be determined not only by the trace system of the respective microcontroller, but also by sampling via the debug interface, highlights PLS. Particualrly useful for MCUs lacking trace support, it notes.<\/p><div class=\"elect-test\" style=\"margin-left: auto; margin-right: auto; text-align: center; \" id=\"elect-120186628\"><div id=\"DFP-EW-InRead1\">\r\n<script type=\"text\/javascript\"> if ($(window).width() > 768) { googletag.display('DFP-EW-InRead1'); } <\/script>\r\n<\/div>\r\n<BR>\r\n<\/div>\n<p>And the debug, trace, and test tool now enables debugging, runtime monitoring, and validation of special, data flow-oriented algorithms. These include those currently incorporated into embedded AI applications. For example, support for the Bosch Data Flow Architecture (DFA), for a highly parallel, dynamically configurable hardware accelerator.<\/p><div class=\"elect-post-content-2\" style=\"margin-left: auto; margin-right: auto; text-align: center; \" id=\"elect-1250808096\"><div id=\"DFP-EW-InRead1-Mobile\">\r\n<script type=\"text\/javascript\"> if ($(window).width() <= 768) { googletag.display('DFP-EW-InRead1-Mobile'); } <\/script>\r\n<\/div>\r\n<\/div>\n<p><strong><a rel=\"image\" href=\"https:\/\/www.electronicsweekly.com\/news\/embedded-world-2026-get-the-full-electronics-weekly-guide-2026-03\/\" target=\"_blank\" rel=\"image noopener\">Read all our Embedded World content \u00bb<\/a><\/strong><\/p>\n<h2>AUTOSAR<\/h2>\n<p>Also in UDE 2026, the CPU use function, for example, now includes runtime analysis of RTOS and AUTOSAR-based applications. For AUTOSAR (AUTomotive Open System ARchitecture) apps, additional operating system hooks defined in the AUTOSAR Runtime Interfaces (ARTI) enable a more detailed visualisation of runtime behaviour.<\/p>\n<p>The company writes:<\/p>\n<p>&#8220;UDE utilizes these [hooks] to display service calls and spinlocks in addition to tasks and interrupts in the execution sequence chart. This facilitates a more precise analysis of application and operating system behavior, making it easier to identify any performance issues.&#8221;<\/p>\n<h2>Python scripting<\/h2>\n<p>Also, there is support to use Python scripts to automate debugging tasks and software tests. Specifically, UDE 2026 offers its own script debugger within the integrated Python console.<\/p>\n<p>This feature enables breakpoints and single-stepping in Python code, says the company, along with the display of Python variables within a dedicated watch window.<\/p>\n<h2>AURIX<\/h2>\n<p>Finally, adaptations have been made to UDE 2026 so support individual MCU families and devices. For example, the Infineon AURIX TC4Dx, the first member of the TC4x family.<\/p>\n<p>PLS writes:<\/p>\n<p>&#8220;Trace support has been extended for monitoring the runtime of virtualized applications, which means that virtual machines managed by the TC4x hardware hypervisor are now also visible in the trace records. In addition, UDE 2026 now also supports trace functions for the so-called production devices. This offers the great advantage of enabling trace recording during both the development phase using emulation devices, which may be cost-intensive, and in the field using standard MCUs.&#8221;<\/p>\n<p>Note that for AURIX TC3xx-based TTControl control units &#8211; for safety-critical applications &#8211; UDE 2026 also provides preconfigured target configurations. This is to provide users of these ECUs with a ready-to-work debug environment, without the need for the respective developer to make ECU-specific configurations beforehand.<\/p>\n<h2>Launch<\/h2>\n<p>The full market launch of UDE 2026 is planned for the beginning of May this year, says Programmierbare Logik &amp; Systeme.<\/p>\n<p>The company&#8217;s &#8211; debug and trace specialists for embedded systems &#8211; range of supported high-end MCUs and embedded processors has also been expanded.<\/p>\n<p>You can read more on the company <a rel=\"image\" href=\"https:\/\/www.pls-mc.com\/news\/ude-2026-offers-even-greater-ease-of-use-with-new-functions\/\" target=\"_blank\" rel=\"nofollow\">website<\/a>.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and embedded processors has also been &#8230;<\/p>\n","protected":false},"author":4274,"featured_media":891293,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[12660,12671],"tags":[13798,14450],"class_list":["post-891291","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-embedded-systems","category-test-measurement-products","tag-debug","tag-embedded-world"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v26.7 (Yoast SEO v27.2) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>PLS extends UDE 2026 for sampling via debug interfaces | Electronics Weekly<\/title>\n<meta name=\"description\" content=\"PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. 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As well as new features, the range of supported high-end MCUs and\",\"breadcrumb\":{\"@id\":\"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#breadcrumb\"},\"inLanguage\":\"en-GB\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#primaryimage\",\"url\":\"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp\",\"contentUrl\":\"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp\",\"width\":1000,\"height\":750},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.electronicsweekly.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Embedded: PLS extends UDE 2026 for sampling via debug interfaces\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.electronicsweekly.com\/#website\",\"url\":\"https:\/\/www.electronicsweekly.com\/\",\"name\":\"Electronics Weekly\",\"description\":\"\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.electronicsweekly.com\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-GB\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.electronicsweekly.com\/#\/schema\/person\/eadb9935cd487ae059d0bc1cfc7a2de9\",\"name\":\"Alun Williams\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-GB\",\"@id\":\"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g\",\"caption\":\"Alun Williams\"},\"description\":\"Web Editor of Electronics Weekly, he is the author of the Gadget Master and Electro-ramblings blogs and also covers space technology news. He has been working in tech journalism for worryingly close to thirty years. In a previous existence, he was a software programmer.\",\"sameAs\":[\"http:\/\/www.electronicsweekly.com\",\"http:\/\/www.facebook.com\/ElectronicsWeekly\",\"https:\/\/x.com\/ElectronicsNews\"],\"url\":\"https:\/\/www.electronicsweekly.com\/author\/alun-williams\/\"}]}<\/script>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"PLS extends UDE 2026 for sampling via debug interfaces | Electronics Weekly","description":"PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/","twitter_card":"summary_large_image","twitter_title":"PLS extends UDE 2026 for sampling via debug interfaces | Electronics Weekly","twitter_description":"PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and","twitter_image":"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp","twitter_creator":"@ElectronicsNews","twitter_site":"@ElectronicsNews","twitter_misc":{"Written by":"Alun Williams","Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#article","isPartOf":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/"},"author":{"name":"Alun Williams","@id":"https:\/\/www.electronicsweekly.com\/#\/schema\/person\/eadb9935cd487ae059d0bc1cfc7a2de9"},"headline":"Embedded: PLS extends UDE 2026 for sampling via debug interfaces","datePublished":"2026-03-13T14:56:50+00:00","dateModified":"2026-03-17T09:56:49+00:00","mainEntityOfPage":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/"},"wordCount":469,"commentCount":0,"image":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#primaryimage"},"thumbnailUrl":"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp","keywords":["Debug","Embedded World"],"articleSection":["Embedded Systems","Test &amp; Measurement"],"inLanguage":"en-GB","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/","url":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/","name":"PLS extends UDE 2026 for sampling via debug interfaces | Electronics Weekly","isPartOf":{"@id":"https:\/\/www.electronicsweekly.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#primaryimage"},"image":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#primaryimage"},"thumbnailUrl":"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp","datePublished":"2026-03-13T14:56:50+00:00","dateModified":"2026-03-17T09:56:49+00:00","author":{"@id":"https:\/\/www.electronicsweekly.com\/#\/schema\/person\/eadb9935cd487ae059d0bc1cfc7a2de9"},"description":"PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and","breadcrumb":{"@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#breadcrumb"},"inLanguage":"en-GB","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/"]}]},{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#primaryimage","url":"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp","contentUrl":"https:\/\/static.electronicsweekly.com\/wp-content\/uploads\/2026\/03\/13145244\/PM_01_2026.width-1000.webp","width":1000,"height":750},{"@type":"BreadcrumbList","@id":"https:\/\/www.electronicsweekly.com\/news\/products\/test-measurement-products\/pls-extends-ude-2026-for-sampling-via-debug-interfaces-2026-03\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.electronicsweekly.com\/"},{"@type":"ListItem","position":2,"name":"Embedded: PLS extends UDE 2026 for sampling via debug interfaces"}]},{"@type":"WebSite","@id":"https:\/\/www.electronicsweekly.com\/#website","url":"https:\/\/www.electronicsweekly.com\/","name":"Electronics Weekly","description":"","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.electronicsweekly.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-GB"},{"@type":"Person","@id":"https:\/\/www.electronicsweekly.com\/#\/schema\/person\/eadb9935cd487ae059d0bc1cfc7a2de9","name":"Alun Williams","image":{"@type":"ImageObject","inLanguage":"en-GB","@id":"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/4a6f9428fc1e0d2cb868c6e720b72f8f97b634b57a87bdf863387d7513cb04bf?s=96&d=mm&r=g","caption":"Alun Williams"},"description":"Web Editor of Electronics Weekly, he is the author of the Gadget Master and Electro-ramblings blogs and also covers space technology news. He has been working in tech journalism for worryingly close to thirty years. In a previous existence, he was a software programmer.","sameAs":["http:\/\/www.electronicsweekly.com","http:\/\/www.facebook.com\/ElectronicsWeekly","https:\/\/x.com\/ElectronicsNews"],"url":"https:\/\/www.electronicsweekly.com\/author\/alun-williams\/"}]}},"_links":{"self":[{"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/posts\/891291","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/users\/4274"}],"replies":[{"embeddable":true,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/comments?post=891291"}],"version-history":[{"count":3,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/posts\/891291\/revisions"}],"predecessor-version":[{"id":891417,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/posts\/891291\/revisions\/891417"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/media\/891293"}],"wp:attachment":[{"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/media?parent=891291"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/categories?post=891291"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.electronicsweekly.com\/wp-json\/wp\/v2\/tags?post=891291"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}