The two models in the SNA5000X-E series can be used for determining the Q factor, bandwidth, and insertion loss of a filter. They feature impedance conversion, movement of measurement plane, fixture simulation, and adapter removal/insertion adjustments.
The VNAs have five sweep types (linear frequency mode, log frequency mode, power sweep
mode, CW time mode, and segment sweep mode).
The SNA5006X-E (pictured) offers a frequency coverage of 9kHz to 6.5GHz and the SNA5003X-E frequency range is 9kHz to 3GHz. Both have a typical dynamic range of 125dB. The compact analysers are intended as cost-effective, entry-level models within the SNA5000 family, said Telonic.
Other features which enable RF components to be characterised include high-resolution measurements with 1Hz frequency resolution, adjustable IF bandwidth from 1Hz to 10MHz, and an output power range from –40dBm to +10dBm.
There are also comprehensive S-parameter measurements, differential analysis, and integrated time-domain functionality. Users can evaluate impedance discontinuities and identify faults within DUTs using the enhanced time-domain analysis and spectrum analysis features. There is also a built-in eye diagram function for signal integrity analysis for high-speed applications.
There are a selection of correction tools to minimise systemic errors caused by cables and fixtures, including automatic fixture removal, port extension, de-embedding, and impedance conversion.
The SNA5000X-E has a 12.1-inch touchscreen with multi-window display and capabilities provides an intuitive and efficient user experience.
The analyser includes one-click filter analysis for rapid extraction of key parameters such as insertion loss and bandwidth. There is also support for SCPI commands and WebServer remote control for integration into automated test systems.
