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Test & Measurement

The latest Electronics Weekly product news on test and measurement technologies, such as oscilloscopes, communication analysers, vector network analysers and test software.

SmartRay ECCO X 050G 3D laser scanning sensor for reflective surfaces

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SmartRay is extending its ECCO X sensor range, for 3D laser scanning, with a model featuring 3D scanning for highly reflective surfaces, the ECCO X 050G sensor. ECCO X 050G It has the capability to measure shiny, reflective and transparent surfaces, such as glass, for example, for automated optical inspection, for manufacturers of mobile phones, camera and eyewear lenses, as ...

Telonic adds Siglent SNA5000X-E VNAs

Telonic Siglent SNA500X-E VNA

The Siglent SNA5000X-E vector network analyser (VNA) series, designed for RF measurement, is now available from Telonic Instruments. The two models in the SNA5000X-E series can be used for determining the Q factor, bandwidth, and insertion loss of a filter. They feature impedance conversion, movement of measurement plane, fixture simulation, and adapter removal/insertion adjustments. The VNAs have five sweep types ...

XJTAG releases XJBoardExplorer as standalone sharing tool

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XJTAG, the automated test equipment specialist, is making its project exploration and sharing tools available as the standalone XJBoardExplorer. Basically, it allows design teams to securely share board data across production and service. This is both internally and with contract manufacturers, using controlled, read-only access. Test engineers can interrogate design data to investigate PCB assembly problems, without attaching to hardware. ...

Teradyne’s Omnyx tests PCBA for AI servers

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Teradyne is introducing Omnyx, a manufacturing test platform for detecting operational defects in printed circuit board assemblies (PCBA). It’s aimed at AI servers and data center systems and the company says it combines structural, parametric, high-speed interconnect and functional testing. The ideal is to allow manufacturers to identify defects earlier in the production process. This would improve yield and quality ...

Marelli and AWS develop STG Agent

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Marelli and AWS have developed a System Test Generation (STG) Agent that automates one of the most critical and work-intensive steps in the validation process: the generation of system test cases from engineering system requirements. This advances the validation cycle because, as vehicle platforms become increasingly software defined, engineering teams must manage large volumes of requirements, engineering data and system ...

Teradyne launches SiPh and CPO tester

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Teradyne has launched an opto-electric automated test platform for high-volume silicon photonics (SiPh) and co-packaged optics (CPO). Photon 100  enables high-throughput, automated testing across all key manufacturing stages, including wafer, optical engine, and co-packaged module insertions. Features: • Integrated Optical & Electrical Instrumentation: Combines advanced optical and electrical test capabilities. • Scalable for High-Volume Manufacturing: Designed to support the demands ...

Embedded: PLS extends UDE 2026 for sampling via debug interfaces

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PLS unveiled its Universal Debug Engine (UDE) 2026 at Embedded World in Nuremberg. As well as new features, the range of supported high-end MCUs and embedded processors has also been expanded. Data can now be determined not only by the trace system of the respective microcontroller, but also by sampling via the debug interface, highlights PLS. Particualrly useful for MCUs ...

Toshiba launches photorelays for test and measurement equipment

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Toshiba has launched four voltage-driven photorelays – TLP3407SRB, TLP3412SRB, TLP3412SRHB and TLP3412SRLB –  targeting test and measurement equipment. They are rated for operation at temperatures up to 135°C and are housed in an ultra-compact S-VSON4T package, measuring just 1.45×2.0mm (typ). As the automotive industry moves towards electrification and autonomous driving, engineers are increasingly challenged to design circuits that can withstand ...

Telonic announces UK release of Siglent SMM3000X SMUs

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Telonic Instruments, the official UK representative of Siglent Technologies, is announcing the UK release of the Siglent SMM3000X series of Source/Measure Units (SMUs). They target engineers working in semiconductor device research, power electronics and advanced materials development. SMM3000X Supporting pulsed current output up to ±10.5A and linear, log and pulsed sweep modes, the series functionality also includes a listing mode. ...

CMX500 radio communication tester covers all NTN technologies

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Rohde & Schwarz’s CMX500 radio communication tester can now cover all non-terrestrial network (NTN) technologies, the company highlights. It also features a Constellation Insight Tool to create a digital twin of the live sky. The one-box tester supports NR-NTN, NB-NTN and Direct-to-Cell (D2C, DTC) technologies. Users can now test all NTN technologies on both network and device level, without the ...